DG5000 Pro Series Multi-channel Waveform Generation Solution Platform Anniversary Special Promotion is Grandly Launched! Celebrate the anniversary and enjoy unparalleled discounts! All optional functions of all models in the full series are Unlocked for Free* for a limited time, helping you meet diverse application needs in semiconductors, photovoltaic inverters, new energy vehicle DC/DC converters, cutting-edge scientific research, education, and hobbies.
Limited-time Special Offer —— Unleash full potential, double efficiency, and celebrate our anniversary with extraordinary value!
*New Orders Only
RIGOL DG5000 Pro Series
New Generation Multi-channel Waveform Generation Solution Platform
The optional features supported by the DG5000 Pro include: Flexible Multi-pulse Function, Advanced Waveform Sequence Function, Multitone Modulation Function, PRBS and Custom Pattern Output, IQ modulation, and a 128 Mpts/channel memory depth upgrade.
Engineered for modern power-semiconductor testing, the DG5000 Pro generates editable pulse trains of 2–30 pulses, enabling quick setup of double-pulse tests (DPT) and similar applications—an ideal tool for analyzing the dynamic behavior of devices like MOSFETs and IGBTs.
Automate tedious, repetitive work. With up to 512-step sequence editing, you can combine waveforms that once required manual switching into a single automated test case. This dramatically boosts test efficiency while ensuring consistency and repeatability in complex workflows.
Equipped with a powerful multi-tone generator, it can effortlessly synthesize composite signals containing up to 16 tones, each with independently editable amplitude and phase. This capability makes it an efficient tool for analyzing intermodulation distortion and other nonlinear characteristics of amplifiers, filters, and similar devices.
With its built-in pattern generator, the instrument can output pseudo-random bit sequences (PRBS2–PRBS32) or user-defined patterns at up to 300 Mbaud. This offers a direct, reliable signal source for eye-diagram and BER testing of high-speed serial buses and digital-interface receivers.
Power semiconductor dynamic parameter testing (a complete set of evaluation methods for the switching characteristics of switching tubes, such as double pulse testing, has been developed based on the half-bridge circuit) is a core evaluation tool in the R&D and application of power semiconductors. It not only provides key dynamic parameters but also reveals the latent risks and optimization directions of devices by simulating actual operating conditions.
